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上海电力大学学报:2019,35(2):111-114
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基于加速退化试验的真空荧光显示器寿命快速预测
(上海电力学院 能源与机械工程学院, 上海 200090)
Rapid Prediction of Vacuum Fluorescent Display Life Based on Accelerated Degradation Test
(School of Energy and Mechanical Engineering, Shanghai University of Electric Power, Shanghai 200090, China)
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投稿时间:2018-04-13    
中文摘要: 为了精确、快速地预测真空荧光显示器(VFD)的常规寿命,在提高阴极灯丝温度的基础上开展了一组VFD加速退化试验。具体做法是:采集加速亮度衰减数据,基于三参数威布尔函数、右逼近法、加速寿命与常规寿命间的关系建立了寿命快速预测模型,从而实现了对VFD寿命的估算。结果表明:提出的寿命预测模型仅借助于一组加速退化试验数据便可精准地估算产品的常规寿命,大大缩短了试验测试时间,降低了寿命预测成本。
Abstract:In order to predict the normal life of vacuum fluorescent display (VFD) accurately and quickly, a group of VFD accelerated degradation tests are carried out by increasing cathode fi-lament temperature, and the test data of accelerated luminance degradation are collected. Besides, the rapid prediction model of VFD life is established on the basis of three-parameter Weibull function, right approximation method and the relation between accelerated life and normal life, and thereby the estimation of VFD life is realized. The results show that the presented model can precisely estimate the normal life of products only with the help of a group of accelerated degradation test data, which greatly shortens the testing time and reduces life prediction cost.
文章编号:20192003     中图分类号:TB114.3    文献标志码:
基金项目:国家自然科学基金(11572187);上海市科学技术委员会项目(18DZ1202105,18DZ1202302)。
引用文本:
宗雨,张建平.基于加速退化试验的真空荧光显示器寿命快速预测[J].上海电力大学学报,2019,35(2):111-114.
ZONG Yu,ZHANG Jianping.Rapid Prediction of Vacuum Fluorescent Display Life Based on Accelerated Degradation Test[J].Journal of Shanghai University of Electric Power,2019,35(2):111-114.