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投稿时间：2020-03-18
投稿时间：2020-03-18
中文摘要: 根据PIE技术基本原型，将软件系统中的对象抽象为PIE技术中的位置概念。以此作为模型的考察粒度，提出了扩展PIE模型。结合随机图理论，建立了基于扩展PIE的软件可测试性计算模型。
Abstract:A new computation model for software testability by the extended PIE technique is put forward.PIE model is a basic dynamical computation method of software testability.This article considers object in software system as basic location of testability, changes research granularity in basic PIE model, and explains extended PIE model;It also combines random graph theory, and builds extended PIE based software testability estimating model.
keywords: PIE model random graph theory testability Cayley tree
文章编号：20210610 中图分类号：TP311 文献标志码：
基金项目:
| 作者 | 单位 | |
| 殷脂 | 上海电力大学 计算机科学与技术学院 | yzzhizhi@163.com |
| Author Name | Affiliation | |
| YIN Zhi | School of Computer and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China | yzzhizhi@163.com |
引用文本：
殷脂.感染免疫理论的软件可测试性计算模型[J].上海电力大学学报,2021,37(6):573-576.
YIN Zhi.Estimating Model of Software Testability Based on PIE[J].Journal of Shanghai University of Electric Power,2021,37(6):573-576.
殷脂.感染免疫理论的软件可测试性计算模型[J].上海电力大学学报,2021,37(6):573-576.
YIN Zhi.Estimating Model of Software Testability Based on PIE[J].Journal of Shanghai University of Electric Power,2021,37(6):573-576.