本文已被：浏览 1154次 下载 2186次
Received:July 05, 2011
中文摘要: 分析了紫外成像技术检测电力设备局部放电的基本原理和影响紫外探测设备探测结果准确度的几种因素,并阐述了紫外成像探测技术的国内外发展状况,结果表明,空气温度、湿度、仪器增益水平、风力,以及测试距离都会对测试结果产生影响。
Abstract:The characteristics and operating principle of UV imaging device are introduced.Then the several factors that have impact on the detection accuracy of the UV-detection equipment are analyzed after describing the development status and trend both at home and abroad.The results show that air temperature,humidity,instrument gain level,the wind,the measurement distance will have an impact on the accurate measurement of partial discharge level and location.
文章编号：20120123 中图分类号： 文献标志码：
基金项目:国家自然科学基金(61107081);上海市教育委员会科研创新项目(10YZ158);上海市自然科学基金(10ZR1412300)
| Author Name | Affiliation | E-mail |
| CUI Hao-yang | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | cuihy@ shiep.edu.cn |
| CHEN Lin | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | |
| TANG Nai-yun | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | |
| TANG Zhong | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | |
| QIAN Ting | Department of Communication and Information Engineering, Shanghai Technical Institute of Electronics and Information,Shanghai 210411,China | |
| Author Name | Affiliation | E-mail |
| CUI Hao-yang | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | cuihy@ shiep.edu.cn |
| CHEN Lin | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | |
| TANG Nai-yun | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | |
| TANG Zhong | School of Computer and Information Engineering,Shanghai University of Electric Power, Shanghai 200090,China | |
| QIAN Ting | Department of Communication and Information Engineering, Shanghai Technical Institute of Electronics and Information,Shanghai 210411,China | |
Reference text:
