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投稿时间：2013-09-13
投稿时间：2013-09-13
中文摘要: 针对软差错影响下的电路可靠性问题,选取了TP算法、EPP方法和PTM方法3种门级电路可靠性评估方法,分别介绍其原理,并结合实验指出了它们的功能、适用范围以及复杂度.
Abstract:To investigate the circuit reliability under the effect of soft errors,such three gate-level circuit reliability estimation methods as TP algorithm,EPP method and PTM method are analyzed,whose function,complexity and extent of application are compared on experiments.
文章编号：20140213 中图分类号： 文献标志码：
基金项目:
| 作者 | 单位 | |
| 王真 | 上海电力学院计算机科学与技术学院 | wangzhenqq@gmail.com |
| Author Name | Affiliation | |
| WANG Zhen | School of Computer Science and Technology, Shanghai University of Electric Power, Shanghai 200090, China | wangzhenqq@gmail.com |
引用文本：
王真.门级电路可靠性评估方法比较[J].上海电力大学学报,2014,30(2):155-160.
WANG Zhen.Comparison of Gate-level Circuit Reliability Estimation Methods[J].Journal of Shanghai University of Electric Power,2014,30(2):155-160.
王真.门级电路可靠性评估方法比较[J].上海电力大学学报,2014,30(2):155-160.
WANG Zhen.Comparison of Gate-level Circuit Reliability Estimation Methods[J].Journal of Shanghai University of Electric Power,2014,30(2):155-160.