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上海电力大学学报:2017,33(1):30-32,38
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微离轴干涉显微系统中光学参数的确定
(上海电力学院 电子与信息工程学院)
Determination of Optical Parameters in Slightly-off-axis Interference Microscopy
(School of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China)
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投稿时间:2016-03-16    
中文摘要: 着重分析了微离轴干涉理论,通过自(互)相关理论确定了微离轴干涉中物参角的大小,由此推得干涉条纹的最佳空间频率.通过与传统干涉法的实验结果对比发现,微离轴干涉成像重建精度高.此外,不同直径的细胞应合理选用不同倍率的物镜,有助于提高后期相位重建的准确度,为进一步提高干涉测量的速度和准确度提供了新方法.
中文关键词: 微离轴干涉  共焦显微  层析  空间频率
Abstract:Slightly-off-axis interferometry theory is introduced and the angle between the object and sample path is calculated via the auto-correlation(cross-correlation) theory.According to this special angle,the optimized fringe spacing is introduced.The slightly-off-axis interference system is compared with on-axis and off-axis interferometry,which is good for high resolution.It is concluded that the biological cells with different size should choose the proper micro objective.As a result,it is convenient for the experiment operating and the enhancement of the phase reconstruction accuracy.The above results shed more lights on novel interferometry.
文章编号:20171007     中图分类号:    文献标志码:
基金项目:国家自然科学基金(61205081);上海市教育委员会科研创新项目(13YZ102);上海市大学生科技创新项目(201210256026).
引用文本:
程伟,江超,薛亮,等.微离轴干涉显微系统中光学参数的确定[J].上海电力大学学报,2017,33(1):30-32,38.
CHENG Wei,JIANG Chao,XUE Liang,et al.Determination of Optical Parameters in Slightly-off-axis Interference Microscopy[J].Journal of Shanghai University of Electric Power,2017,33(1):30-32,38.